Components Books

Gives an excellent view of the state of the art in behavioral synthesis. At DAC, I saw many folks from companies that sell behavioral synthesis tools buying this book. The book is very useful for anyone designing beh synthesis tools and talks about a parallelizing compiler way of doing things.

This book was a really interesting book. I liked all of the technical things in it. I thought the book was really cool and my dad liked it, too. (My dad had to help me a little.)I loved it!

This book contains myriad of design and fabrication information that even the novice engineer (or even a Marketing type) can benefit from. His book is considered the bible for Microwave Circuit Design Engineers who must evaluate and design Power dividers, couplers, filters, mixers and other similar devices.

It is written in a clear and concise manner certain to make the theory of operation and practical manufacturing methods easy to understand and relate to. It is a MUST for every MW/RF Engineer's library - at home and at work.

It has been a great help to me regarding substrate noise analysis. Very well explained and detailed.

very good book for a SMT manager

The book is a good write-up on latest development of symbolic analysis. The approaches in the book can be easily integrated into commercial EDA tools.

optimisation in design of heat exchanger

Mr. Nasca's book reflects a broad range of knowledge and experience in testing fluid power components. The book is a useful manual for field technicians and engineers alike. Its comprehensive scope is destined to make it the only standard reference guide for testing throughout the fluid power industry. A great achievement!

Over 30% of today's designs implements embedded memories and continuously consumes more and more die area. While embedded memory presents significant system performance and cost reduction advantages, it brings its own testing issues. Test vector style tests are not suitable for verifying embedded memory arrays because it is too costly. This is because the time spent in the manufacturing tester grows exponentially as the embedded memory die area increases. Sometimes it is impossible to create a set of vectors that can detect all possible types of memory defect.

Implementing embedded memory built in self-test (BIST) can alleviate these problems. In simplistic terms, memory BIST is an on-chip utility that enables the execution of a proven set of algorithmic style verification tests directly on the memory array. These tests can be executed at the design's full operating frequency to prove the memory array operations and identify errors caused by silicon defects.

Embedded memories are the most dense components within a system-on-chip (SOC), accounting for up to 90% of its real estate.1 Memories also are the most sensitive to process defects, making it essential to thoroughly test them in the SOCs.

Because memories are used as test vehicles for monitoring the silicon process and improving its yield, extracting additional diagnostic data to determine the causes of failures now is required in the testing strategy. In addition to diagnosis, many embedded memories are designed with built-in redundancy, which provides spare rows and columns that can replace failing locations. Redundancy enables the manufacturer to repair a number of otherwise defective devices to ensure maximum production yield.
Characteristics of today's SOC designs include the following:

1. Typically more than 30 embedded memories on a chip.
2. Memories scattered around the device rather than concentrated in one location.
3. Different types and sizes of memories.
4. Memories doubly embedded inside embedded cores.
5. Test access to these memories from only a few chip I/O pins.

A deep-submicron test strategy will have to handle all of these memory issues.
These issues are being addressed by the use of built-in self-test (BIST). BIST is the methodology of choice for testing embedded memories within SOCs. It offers a simple and low-cost means to test for failures of embedded memories without significantly impacting device performance.

While it has been used primarily for production pass/fail testing, BIST can be extended to provide the diagnostic data required for process monitoring and repair. Although the area overhead required by the BIST circuitry is increased, designing the diagnostic circuitry into the BIST provides many advantages in terms of time for both setup and test.

This book will take you intensively through all the memory BIST algorithms and ways to test them. I consider this as the bible for mbist testing.

I am pleased to discover that this book is now available through Amazon.com. It's been a while since I read it, but I can still say quite a bit about it. It is a rich and accurate treatment of Tucker's Three-Mode Factor Analysis. This is a method for performing factor analysis of multiple matrices at once, recovering their common factor structure as well as differences and interrelations among factors in the different "modes" (such as the person mode, the variable mode, and the occasion mode. Of course there are other useful methods for analyzing three way data, but Tucker's method is one of the two most important and basic ones. It has been the basis of many subsequent developments and is still playing an important role in the development of new methods.
I believe that the book is based on both Kroonenberg's Ph.D. dissertation (at the university of Leiden), and his more general knowledge of this method and area. Thesis or not, it has now been nicely organized into interestingly different and digestible chapters, and includes an index and extensive bibliography.
But you should know that it is only a paperback. Also, there are a few places where you can detect that the author is not a native english speaker -- but generally this is undetectable.
Granted, it is not casual reading, but it is clear. It requires no mathematics beyond basic algebra, and assumes no prior knowledge in three-way analysis. While it is technical, it is still approachable. The book not only includes and explains the basic theory but also provides a number of example applications that are designed to illustrate different ways that the methodology could be used and the results could be interpreted. (One, for example, is based on a three way analysis of responses by the woman who was the real life basis for the famous account of multiple personality described in the book "the three faces of Eve"). It also discusses the estimation or fitting of the model's parameters.
In my view, this book is not only the most important presentation of this very important method, but also serves as a fundamental reference and resource on the method. I would even go so far as to make that classic remark that "this book should be on the bookshelf of anyone using or interested in learning about" Tucker's three-mode methods. (As you may have guessed, it is on mine.)
What more can I say?